DocumentCode :
3316402
Title :
Multipath fading measurements for multi-antenna backscatter RFID at 5.8 GHz
Author :
Griffin, Joshua D. ; Durgin, Gregory D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
fYear :
2009
fDate :
27-28 April 2009
Firstpage :
322
Lastpage :
329
Abstract :
UHF and microwave backscatter RF-tag systems, including radio frequency identification (RFID) and sensor systems, experience multipath fading that can be more severe than that found in a conventional transmitter-to-receiver channel. Previous work has shown that multipath fading can be reduced on the modulated-backscatter signal received from the RF tag in a non-line-of-sight (NLOS) channel if more than one RF-tag antenna is used to modulate backscatter. This paper presents the first multipath fading measurements for backscatter tags using multiple antennas at 5.79 GHz - the center of the 5.725-5.850 GHz, unlicensed industrial, scientific, and medical (ISM) frequency band that may offer reliable operation for future, miniature RF tags. NLOS measurement results are presented as cumulative density functions (CDF) and fade margins for use in backscatter radio link budget analysis and a detailed description of the custom backscatter testbed used to take the measurements is provided. The measurements show that gains are available for multiple-antenna RF tags and results match well with gains predicted using the analytic fading distributions derived previously.
Keywords :
antennas; fading channels; multipath channels; radiofrequency identification; RF-tag antenna; RFID; cumulative density functions; multi-antenna backscatter; multipath fading measurements; multiple antennas; non-line-of-sight channel; radio frequency identification; transmitter-to-receiver channel; Antenna measurements; Backscatter; Density measurement; Fading; RF signals; Radio frequency; Radiofrequency identification; Receiving antennas; Sensor systems; UHF measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
RFID, 2009 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3337-7
Electronic_ISBN :
978-1-4244-3338-4
Type :
conf
DOI :
10.1109/RFID.2009.4911197
Filename :
4911197
Link To Document :
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