DocumentCode :
3316578
Title :
Methods for enhancing low-noise CFA performance (crossed-field amplifiers)
Author :
Dionne, N.J. ; Griffin, W. ; Smith, W.
Author_Institution :
Raytheon Co., Waltham, MA, USA
fYear :
1990
fDate :
9-12 Dec. 1990
Firstpage :
529
Lastpage :
532
Abstract :
Excess noise generation in crossed-field devices is identified with the turbulent flow within the so-called hub region or the space-charge layer close to the cathode emitting surface. For magnetrons, ultralow noise operation is achieved by a decrease in externally supplied filament power to the thermionic emitter. However, in the case of pulsed, re-entrant CFAs (cross-field amplifiers) using secondary emitters, the means for attaining comparable reductions are more elusive, particularly for forward-wave versions of the device. Various methods for enhancing its signal-to-noise performance have been evaluated experimentally with modest success. Provision for RF circuits and geometrical structure such as axially directed grooves in the cathode generally has resulted in noise floor reduction by an order of magnitude. A barreling magnetic field shape of several percent has also demonstrated incremental efficiency improvements, extending the effective range over which the random noise improvement is achieved.<>
Keywords :
cathodes; electron device noise; magnetic fields; microwave amplifiers; microwave tubes; RF circuits; SNR performance enhancement; axially directed grooves; barreling magnetic field shape; cathode emitting surface; cross-field amplifiers; forward-wave versions; geometrical structure; hub region; low noise performance; noise floor reduction; pulsed reentrant type; random noise improvement; secondary emitters; space-charge layer; turbulent flow; ultralow noise operation; Cathodes; Circuit noise; Magnetic noise; Magnetrons; Noise generators; Noise shaping; Power supplies; Pulse amplifiers; Radio frequency; Radiofrequency amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1990.237052
Filename :
237052
Link To Document :
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