Title :
Phase noise analysis of a tail-current shaping technique employed on a BiCMOS voltage controlled oscillator
Author :
Lambrechts, J.W. ; Sinha, S.
Author_Institution :
Dept. of Electr., Electron. & Comput. Eng., Univ. of Pretoria, Pretoria, South Africa
Abstract :
A BiCMOS Silicon Germanium cross-coupled differential-pair narrowband voltage controlled oscillator with a tail-current shaping technique to improve phase noise performance is implemented and experimental results are presented. Several VCOs are fabricated on-chip to serve for a practical comparison and the results are also compared to simulated results. Simulation results provided a 3.3 dBc/Hz improvement from -105.3 dBc/Hz to -108.6 dBc/Hz at a 1 MHz offset frequency from the 5 GHz carrier. Measured results confirm the correlation of phase noise performance between simulation and prototype. Acceptable phase noise performance compared to previous works is achieved using a relatively cost-effective technology.
Keywords :
BiCMOS analogue integrated circuits; Ge-Si alloys; phase noise; semiconductor materials; voltage-controlled oscillators; BiCMOS voltage controlled oscillator; SiGe; differential-pair voltage controlled oscillator; narrowband voltage controlled oscillator; phase noise analysis; silicon germanium cross-coupled VCO; tail-current shaping; BiCMOS integrated circuits; Capacitors; Inductors; Phase noise; Transistors; Voltage-controlled oscillators; Active circuit; Bipolar CMOS (BiCMOS); LC oscillator; Silicon Germanium (SiGe); analogue integrated circuit (IC); heterojunction bipolar transistor (HBT); narrowband; single sideband (SSB); voltage controlled oscillator (VCO);
Conference_Titel :
Semiconductor Conference (CAS), 2010 International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4244-5783-0
DOI :
10.1109/SMICND.2010.5650476
