• DocumentCode
    3316757
  • Title

    Phase noise analysis of a tail-current shaping technique employed on a BiCMOS voltage controlled oscillator

  • Author

    Lambrechts, J.W. ; Sinha, S.

  • Author_Institution
    Dept. of Electr., Electron. & Comput. Eng., Univ. of Pretoria, Pretoria, South Africa
  • Volume
    02
  • fYear
    2010
  • fDate
    11-13 Oct. 2010
  • Firstpage
    509
  • Lastpage
    512
  • Abstract
    A BiCMOS Silicon Germanium cross-coupled differential-pair narrowband voltage controlled oscillator with a tail-current shaping technique to improve phase noise performance is implemented and experimental results are presented. Several VCOs are fabricated on-chip to serve for a practical comparison and the results are also compared to simulated results. Simulation results provided a 3.3 dBc/Hz improvement from -105.3 dBc/Hz to -108.6 dBc/Hz at a 1 MHz offset frequency from the 5 GHz carrier. Measured results confirm the correlation of phase noise performance between simulation and prototype. Acceptable phase noise performance compared to previous works is achieved using a relatively cost-effective technology.
  • Keywords
    BiCMOS analogue integrated circuits; Ge-Si alloys; phase noise; semiconductor materials; voltage-controlled oscillators; BiCMOS voltage controlled oscillator; SiGe; differential-pair voltage controlled oscillator; narrowband voltage controlled oscillator; phase noise analysis; silicon germanium cross-coupled VCO; tail-current shaping; BiCMOS integrated circuits; Capacitors; Inductors; Phase noise; Transistors; Voltage-controlled oscillators; Active circuit; Bipolar CMOS (BiCMOS); LC oscillator; Silicon Germanium (SiGe); analogue integrated circuit (IC); heterojunction bipolar transistor (HBT); narrowband; single sideband (SSB); voltage controlled oscillator (VCO);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference (CAS), 2010 International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4244-5783-0
  • Type

    conf

  • DOI
    10.1109/SMICND.2010.5650476
  • Filename
    5650476