• DocumentCode
    331698
  • Title

    Understanding what "success" means in assessment [of engineering education]

  • Author

    Piket-May, M.J. ; Chang, J.L. ; Avery, J.P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    4-7 Nov. 1998
  • Firstpage
    20
  • Abstract
    The University of Colorado at Boulder\´s Integrated Teaching and Learning Lab (ITLL) opened in the USA in April 1997. ITLL is an innovative facility designed to encourage experiential, hands-on learning across all engineering disciplines. The setting was designed to strengthen the creative problem solving skills of students while working in a multidisciplinary team. The lab has anecdotally been a great success in its use so far, however a focused general assessment plan must be developed to understand the long term impact. In order to develop a general assessment plan for the ITLL program, one first needs to identify what needs to be assessed. The general discussion of this paper focuses on "what does it mean to be a successful engineering student?" In order to come up with a definition of success, the authors looked at many issues and studied many current assessment techniques reported in literature. This paper discusses the definition of success for engineering education programs.
  • Keywords
    engineering education; student experiments; USA; assessment techniques; creative problem solving skills; educational success; engineering education assessment; hands-on learning; multidisciplinary teamworking; students; Design engineering; Educational institutions; Engineering drawings; Engineering education; Engineering students; Feedback; Laboratories; Monitoring; Particle measurements; Problem-solving;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers in Education Conference, 1998. FIE '98. 28th Annual
  • Conference_Location
    Tempe, AZ, USA
  • ISSN
    0190-5848
  • Print_ISBN
    0-7803-4762-5
  • Type

    conf

  • DOI
    10.1109/FIE.1998.736792
  • Filename
    736792