• DocumentCode
    3317690
  • Title

    Vertical MOS transistor with threshold voltage adjustment

  • Author

    Mori, Kiyoshi

  • Author_Institution
    Sony Semicond. Corp., Japan
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    A sub-half micron channel length vertical MOS transistor was successfully developed for processing with less expensive process equipment. One of the important advantages of vertical MOS transistor technology is that the channel length scaling is not limited by the minimum lithographic resolution. The vertical MOS transistor, by virtue of increased W and smaller L, allowed the utilization of the side-walls of a 3D trench to form the transistor channel. The device will have much higher drain current and operating frequency than a planar MOS transistor patterned in the same planar surface area. Conventional processes such as ion implantation cannot be used to control the threshold voltage (Vt) of a vertical MOS transistor. A new method for diffusion of the impurities from a doped CVD film was successfully developed for vertical MOS transistor Vt adjustment
  • Keywords
    CVD coatings; MOSFET; diffusion; doping profiles; semiconductor doping; 3D trench side-walls; channel length; channel length scaling; doped CVD film; drain current; impurity diffusion; ion implantation; lithographic resolution; operating frequency; planar MOS transistor; planar surface area patterning; process equipment; threshold voltage adjustment; transistor channel; vertical MOS transistor; vertical MOS transistor technology; Design engineering; Diffusion processes; Fabrication; Impurities; MOSFETs; Manufacturing; Plasma temperature; Random access memory; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-5502-4
  • Type

    conf

  • DOI
    10.1109/IEMT.1999.804828
  • Filename
    804828