DocumentCode
3318301
Title
Amorphous silicon four quadrant orientation detector (FOQUOD) for application to neural network image sensors
Author
Wen-Jyh Sah ; Si-Chen Lee
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
1990
fDate
9-12 Dec. 1990
Firstpage
291
Lastpage
294
Abstract
An a-Si:H orientation detector is presented which can extract both the position and the orientation of an edge passing through it. It is sensitive to half plane, thin line, and even gradient contrast with preferential orientation, and the output signal is independent of the illumination level and the position of the edge in the device area. The device structure is described and experimental results are presented.<>
Keywords
amorphous semiconductors; elemental semiconductors; hydrogen; image sensors; pattern recognition; photodetectors; picture processing; silicon; FOQUOD; amorphous Si:H; device structure; edge position independent; experimental results; four quadrant orientation detector; gradient contrast; half plane detection; illumination independent; neural network image sensors; preferential orientation; semiconductors; thin line detection; Amorphous silicon; Detectors; Lighting;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1990.237172
Filename
237172
Link To Document