Title :
Debug methods for hybrid CPU/FPGA systems
Author :
Roesler, Eric ; Nelson, Brent
Author_Institution :
Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
Abstract :
The combining of one or more CPU´s and an FPGA fabric on the same die is growing in popularity. Such programmable system-on-chip (PSOC) systems promise performance and development time advantages over conventional technology. In a PSOC design, design errors may occur in many different places - the design of the CPU, the embedded software, the FPGA-based parts of the design, or the interfaces between these various parts. This paper presents a flexible tool that allows the user to dynamically adapt the CAD tool´s behavior to the level of detail needed to track down design errors in PSOC designs. It provides for the creation of and coexistence of software source debuggers and gate level debug tools, all incorporated into the same debugging environment. A prototype PSOC debugging system based on a derivative of the JHDL CAD tool is presented which illustrates the range of debug support in both simulation and hardware execution modes that can be provided for PSOC debug. Extensions to the tool to support a wider range of embedded processors and GNU compiler tools are discussed along with conclusions and future work.
Keywords :
circuit CAD; circuit simulation; computer debugging; field programmable gate arrays; logic CAD; program debugging; system-on-chip; FPGA fabric; GNU compiler tools; JHDL CAD tool; debug methods; debug support; debugging environment; design errors; embedded CPUs; flexible tool; gate level debug tools; hardware execution modes; hybrid CPU/FPGA systems; programmable SoC systems; programmable system-on-chip; simulation modes; software source debuggers; Design automation; Embedded software; Fabrics; Field programmable gate arrays; Hardware; Software debugging; Software prototyping; Software tools; System-on-a-chip; Virtual prototyping;
Conference_Titel :
Field-Programmable Technology, 2002. (FPT). Proceedings. 2002 IEEE International Conference on
Print_ISBN :
0-7803-7574-2
DOI :
10.1109/FPT.2002.1188688