• DocumentCode
    33187
  • Title

    An All-SiC High-Frequency Boost DC–DC Converter Operating at 320 °C Junction Temperature

  • Author

    Xueqian Zhong ; Xinke Wu ; Weicheng Zhou ; Kuang Sheng

  • Author_Institution
    Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
  • Volume
    29
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    5091
  • Lastpage
    5096
  • Abstract
    This letter presents the design, prototype development, operation, and testing of an 800 kHz, 1 kW, 800 V output boost dc-dc converter module that integrates SiC MOSFET and SiC Schottky diode die. It is observed that when the device loss is dominated by switching loss, the steady-state junction temperature of SiC MOSFET can reach as high as 320°C. This is the highest self-heated junction temperature operation of SiC power devices under room temperature ambient reported in the literature. The high-frequency switching characteristics and high-temperature thermal reliability of the assessed converter are evaluated in detail. A solder-molten phenomenon during high junction temperature operation is detected and the die-attachment material is thus improved to enhance the high-temperature thermal reliability of the converter module. This study shows that the high-frequency capability of a gate driver and high-temperature die-attachment technology can be limiting factors preventing SiC power devices from operating at higher junction temperatures.
  • Keywords
    DC-DC power convertors; MOSFET; Schottky diodes; power integrated circuits; reliability; silicon compounds; wide band gap semiconductors; MOSFET; Schottky diode die; SiC; device loss; die-attachment material; frequency 800 kHz; gate driver; high-frequency boost DC-DC converter; high-frequency capability; high-frequency switching characteristics; high-temperature die-attachment technology; high-temperature thermal reliability; power 1 kW; power devices; self-heated junction temperature; solder-molten phenomenon; steady-state junction temperature; switching loss; voltage 800 V; Junctions; MOSFET; Silicon carbide; Switches; Temperature; Temperature measurement; Thermal resistance; Boost converter; high frequency; high temperature; junction temperature; silicon carbide (SiC);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2014.2311800
  • Filename
    6766689