DocumentCode
33187
Title
An All-SiC High-Frequency Boost DC–DC Converter Operating at 320 °C Junction Temperature
Author
Xueqian Zhong ; Xinke Wu ; Weicheng Zhou ; Kuang Sheng
Author_Institution
Coll. of Electr. Eng., Zhejiang Univ., Hangzhou, China
Volume
29
Issue
10
fYear
2014
fDate
Oct. 2014
Firstpage
5091
Lastpage
5096
Abstract
This letter presents the design, prototype development, operation, and testing of an 800 kHz, 1 kW, 800 V output boost dc-dc converter module that integrates SiC MOSFET and SiC Schottky diode die. It is observed that when the device loss is dominated by switching loss, the steady-state junction temperature of SiC MOSFET can reach as high as 320°C. This is the highest self-heated junction temperature operation of SiC power devices under room temperature ambient reported in the literature. The high-frequency switching characteristics and high-temperature thermal reliability of the assessed converter are evaluated in detail. A solder-molten phenomenon during high junction temperature operation is detected and the die-attachment material is thus improved to enhance the high-temperature thermal reliability of the converter module. This study shows that the high-frequency capability of a gate driver and high-temperature die-attachment technology can be limiting factors preventing SiC power devices from operating at higher junction temperatures.
Keywords
DC-DC power convertors; MOSFET; Schottky diodes; power integrated circuits; reliability; silicon compounds; wide band gap semiconductors; MOSFET; Schottky diode die; SiC; device loss; die-attachment material; frequency 800 kHz; gate driver; high-frequency boost DC-DC converter; high-frequency capability; high-frequency switching characteristics; high-temperature die-attachment technology; high-temperature thermal reliability; power 1 kW; power devices; self-heated junction temperature; solder-molten phenomenon; steady-state junction temperature; switching loss; voltage 800 V; Junctions; MOSFET; Silicon carbide; Switches; Temperature; Temperature measurement; Thermal resistance; Boost converter; high frequency; high temperature; junction temperature; silicon carbide (SiC);
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2014.2311800
Filename
6766689
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