• DocumentCode
    3318742
  • Title

    Integrated intelligent electrodes for electrical capacitance tomography

  • Author

    Williams, Philip ; York, Trevor

  • Author_Institution
    Dept. of Electr. Eng. & Electron., Univ. of Manchester Inst. of Sci. & Technol., UK
  • fYear
    1996
  • fDate
    35235
  • Abstract
    Preliminary investigations are described that consider the architecture for an electrical capacitance tomography system in which the processing circuitry for each `channel´ is mounted directly onto each electrode. The work is motivated by the desire to improve signal-to-noise by increasing the operating frequency. This, in turn, requires reduction of stray capacitance. Almost all of the electronic circuitry is included on a custom silicon integrated circuit that is implemented using a high voltage BiCMOS technology. The chip includes the front-end charge-discharge circuit with differential amplification, programmable gain and offset compensation, and analogue-to-digital conversion. Data communication with the host is via a serial shift register and each electrode requires less than 10 electrical connections
  • Keywords
    computerised tomography; Si; analogue-to-digital conversion; custom Si integrated circuit; data communication; differential amplification; electrical capacitance tomography system; electrical connections; electronic circuitry; front-end charge-discharge circuit; high voltage BiCMOS technology; integrated intelligent electrodes; offset compensation; operating frequency; processing circuitry; programmable gain; serial shift register; signal-to-noise; stray capacitance;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advances in Electrical Tomography (Digest No: 1196/143), IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • DOI
    10.1049/ic:19960843
  • Filename
    578009