DocumentCode :
3318791
Title :
A fully integrated 26 dBm linearized RF power amplifier in 65nm CMOS technology
Author :
Ahmad, Waqas ; Leijun Xu ; Tormanen, Markus ; Sjoland, Henrik
Author_Institution :
Dept. of Electr. & Inf. Technol. (EIT), Lund Univ., Lund, Sweden
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
1306
Lastpage :
1309
Abstract :
In this paper, design and measurements of a fully integrated power amplifier (PA) are presented. The PA consists of two amplifying chains each having a driver and a power stage. A low loss on chip power combiner combines the outputs from two amplifying chains, and also performs impedance transformation and differential to single-ended conversion. To linearize the PA, the driver stage is biased in class-C, acting as a pre-distorter for the power stage which is biased in class-AB. The linearization scheme is validated by measurements, improving the third order intermodulation distortion (IMD3) by 7dB, output referred 1-dB compression point by 4dB, and adjacent channel leakage ratio (ACLR) by 4.5 dB. With a supply voltage of 2.2V, the PA delivers a saturated output power of 26.1 dBm with a power added efficiency (PAE) of 26.8% at operating frequency of 2.24 GHz. The measured power gain of the PA is 21.8 dB, and the output referred 1-dB compression point is 25.4 dBm. The ACLR1 (5 MHz offset) is better than -33 dBc while transmitting a 23dBm WCDMA signal. The circuit is manufactured in a standard 65nm CMOS process and occupies 1mm2 of chip area.
Keywords :
CMOS integrated circuits; UHF power amplifiers; code division multiple access; driver circuits; intermodulation distortion; power combiners; CMOS technology; WCDMA signal; adjacent channel leakage ratio; amplifying chains; differential conversion; driver stage; efficiency 26.8 percent; frequency 2.24 GHz; fully integrated linearized RF power amplifier; impedance transformation; linearization scheme; low loss on chip power combiner; power stage; pre-distorter; single-ended conversion; size 65 nm; third order intermodulation distortion; voltage 2.2 V; CMOS integrated circuits; CMOS technology; Gain; Multiaccess communication; Power generation; Semiconductor device measurement; Spread spectrum communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
Type :
conf
DOI :
10.1109/ISCAS.2015.7168881
Filename :
7168881
Link To Document :
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