Title :
A 500 Mb/s 10/32 channel, 0.5 μm CMOS VCSEL driver with built-in self-test and clock generation circuitry
Author :
Kiamilev, Fouad E.
Author_Institution :
North Carolina Univ., Charlotte, NC, USA
Abstract :
We have designed and fabricated 10 and 32 channel CMOS VCSEL driver ICs with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Optoelectronics Industry Association (OIDA)
Keywords :
CMOS integrated circuits; built-in self test; clocks; driver circuits; integrated optoelectronics; semiconductor lasers; surface emitting lasers; 0.5 mum; 500 Mbit/s; CMOS VCSEL driver ICs; Mb/s 10/32 channel 0.5 μm CMOS VCSEL driver; Optoelectronics Industry Association; built-in self-test circuitry; circuit design; clock generation circuitry; research community; silicon parts; Built-in self-test; Circuit synthesis; Circuit testing; Clocks; Current measurement; Driver circuits; Laser modes; Optical design; Silicon; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4947-4
DOI :
10.1109/LEOS.1998.737784
