Title :
International Electron Devices Meeting 1990. Technical Digest [Front Cover]
Abstract :
Presents the front cover from the conference proceedings.
Keywords :
VLSI; display devices; image sensors; integrated circuit technology; integrated memory circuits; monolithic integrated circuits; semiconductor devices; semiconductor technology; vacuum microelectronics; BiCMOS; CMOS; Monte Carlo simulation; SRAM; Si; SiGe; ULSI; bipolar devices; charge coupled devices; compound semiconductor FETs; displays; dynamic memories; equipment modeling; hot-carrier effects; image sensors; interconnect materials; linear beam devices; nonvolatile memory; process modeling; quantum transport; reliability; thin-film transistors; vacuum microelectronics;
Conference_Titel :
Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/IEDM.1990.237240
