Title :
Conditions for removing intersample ripples in multirate control
Author :
Tangirala, Arm K. ; Shah, Sirish L. ; Chen, Tongwen
Author_Institution :
Dept. of Chem. & Mater. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
Multirate systems arise when signals of interest are sampled at different rates. Measurements from chemical processes are typically available at different sampling rates. For example, composition estimates in a distillation column are available at a much slower rate than flow, temperature and pressure measurements. Multirate systems pose a challenging problem due to several reasons such as increased complexity design, time-varying nature, etc. Systems consisting of fast-rate control moves and slow-sampled outputs are a common scenario in chemical processes and of practical interest. Traditionally, inferential techniques based on secondary measurements have been used to design the fast-rate input moves. Lifting techniques conveniently transform multirate systems to single-rate lifted systems with increased dimensionality. Controllers designed using lifting techniques require that certain causality constraints are satisfied. We show firstly, that intersample ripples can arise in the closed-loop output of a multirate system as a result of non-uniform gains of the discrete lifted system and inverse lifting. Secondly, we present conditions on the controller gains to avoid intersample ripples.
Keywords :
MIMO systems; chemical technology; closed loop systems; process control; sampled data systems; signal sampling; causality constraints; chemical processes; complexity design; composition estimates; discrete lifted system; distillation column; fast-rate control moves; intersample ripples; inverse lifting; lifting techniques; multirate control; multirate systems; nonuniform gains; single-rate lifted systems; slow-sampled outputs; Chemical processes; Control systems; Distillation equipment; Frequency; MIMO; Pressure measurement; Sampling methods; Switches; Temperature measurement; Time varying systems;
Conference_Titel :
Electrical and Computer Engineering, 1999 IEEE Canadian Conference on
Conference_Location :
Edmonton, Alberta, Canada
Print_ISBN :
0-7803-5579-2
DOI :
10.1109/CCECE.1999.804949