• DocumentCode
    3319388
  • Title

    Automated testing process for electromagnetic interference and compatibility testing facility

  • Author

    Hussain, Intikhab ; Usman, Umar ; Iqbal, Yasir ; Shafqat, Ahmed ; Mushtaq, Abid

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci. (SEECS), NUST, Islamabad, Pakistan
  • fYear
    2011
  • fDate
    22-24 Dec. 2011
  • Firstpage
    244
  • Lastpage
    249
  • Abstract
    So far all the efforts to automate the EMI/EMC testing facility consider only the automation of instruments used in these tests, for example Antenna, Spectrum Analyzer, RF Generator and different software to manipulate the results of these tests. Movement of Device Under Test (DUT) has not been automated to meet the new standards. Currently it is being done manually by switching off the test setup. This discontinuity increases the testing time along with the increase in error. If different operators are involved in performing these tests, it also increases human error. We have designed an automatic testing process to speed up the tests along with improving the precision and accuracy of test measurements. It also helps to avoid human health hazards. By using the suggested improved testing process, we have decreased the testing time by about 50%, increased accuracy by more than 20% and precision by 40% respectively.
  • Keywords
    automatic testing; electromagnetic compatibility; electromagnetic interference; health hazards; test facilities; EMI-EMC testing facility; RF generator; antenna; automated testing process; device under test; electromagnetic compatibility testing facility; electromagnetic interference; human health hazards; spectrum analyzer; test measurements; Electromagnetic compatibility; Manuals; Radio frequency; Testing; EMI/EMC test automation trend; Electromagnetic Interference & Electromagnetic Compatibility (EMI/EMC) Automation; Improved EMI/EMC testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multitopic Conference (INMIC), 2011 IEEE 14th International
  • Conference_Location
    Karachi
  • Print_ISBN
    978-1-4577-0654-7
  • Type

    conf

  • DOI
    10.1109/INMIC.2011.6151481
  • Filename
    6151481