DocumentCode :
3319849
Title :
Semi-insulating epitaxial layers for optoelectronic devices
Author :
Lourdudoss, S. ; Söderström, D. ; Barrios, C. Angulo ; Sun, Y.T. ; Messmer, E. Rodríguez
Author_Institution :
Dept. of Electron., R. Inst. of Technol., Kista, Sweden
fYear :
2000
fDate :
2000
Firstpage :
171
Lastpage :
178
Abstract :
Semi-insulating epitaxial layers of InP:Fe, GaAs:Fe and GaInP:Fe have been grown. To avoid the often observed inter-diffusion between Fe and Zn, two remedies are proposed using InP:Fe/InP:Zn as an example. One is co-doping InP with sulphur and iron and the other is to use ruthenium instead of iron. In situ mesa etching can also hinder side wall stimulated diffusion. Epitaxial lateral overgrowth studies of InP on a masked surface indicate promising feasibility of integrating SI InP on silicon. InP:Fe and GaInP:Fe/GaAs are found to be useful in the buried heterostructure laser fabrication. Buried in-plane lasers have shown very good thermal and high modulation properties. Buried vertical cavity surface emitting lasers can be pumped up to 97°C under continuous operation
Keywords :
III-V semiconductors; etching; optical modulation; semiconductor epitaxial layers; semiconductor lasers; surface emitting lasers; 97 degC; AlGaAs; GaAs; GaInP:Fe; InP:Fe; InP:Fe,S; InP:Ru; InP:Zn; Si; buried heterostructure laser fabrication; buried in-plane lasers; buried vertical cavity surface emitting lasers; co-doping; epitaxial lateral overgrowth studies; in situ mesa etching; inter-diffusion avoidance; laser pumping; masked surface; optoelectronic devices; semi-insulating epitaxial layers; side wall stimulated diffusion hindrance; Epitaxial layers; Etching; Indium phosphide; Iron; Optoelectronic devices; Pump lasers; Silicon; Surface emitting lasers; Vertical cavity surface emitting lasers; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconducting and Insulating Materials Conference, 2000. SIMC-XI. International
Conference_Location :
Canberra, ACT
Print_ISBN :
0-7803-5814-7
Type :
conf
DOI :
10.1109/SIM.2000.939221
Filename :
939221
Link To Document :
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