Title :
Photoluminescence of native-like shallow acceptor generated during annealing of semi-insulating GaAs
Author :
Surma, B. ; Wnuk, A. ; Strzelecka, St. ; Gladysz, M. ; Jurkiewicz-Wegner, E. ; Hruban, A. ; Dubecký, F.
Author_Institution :
Inst. of Electron. Mater. Technol., Warszawa, Poland
Abstract :
The new PL lines at 1.496 eV and 1.192 eV related to the conduction band-to-acceptor and donor-to-acceptor transitions, respectively were observed in the PL spectrum of bulk undoped LEC SI-GaAs and in some SI-GaAs crystals grown by the VGF technique. No correlation between these PL lines and the shallow residual acceptor impurity was stated. The acceptor responsible for these PL lines can be created during rapid cooling from temperature T>1000°C, so it seems to be a native-like complex. It is difficult to present a detailed model of this defect. However, one can conclude that a native-like shallow acceptor can be present in as grown undoped LEC SI-GaAs crystals when the cooling of the crystal in the puller occurs quickly
Keywords :
III-V semiconductors; gallium arsenide; impurity states; photoluminescence; rapid thermal annealing; 1.492 eV; 1.496 eV; 1000 degC; GaAs; PL lines; VGF technique; annealing; as grown undoped LEC SI-GaAs crystals; conduction band-to-acceptor transition; donor-to-acceptor transition; native-like complex; native-like shallow acceptor; photoluminescence; rapid cooling; semi-insulating GaAs; shallow residual acceptor impurity; Annealing; Cooling; Crystals; Density measurement; Etching; Excitons; Gallium arsenide; Impurities; Photoluminescence; Temperature;
Conference_Titel :
Semiconducting and Insulating Materials Conference, 2000. SIMC-XI. International
Conference_Location :
Canberra, ACT
Print_ISBN :
0-7803-5814-7
DOI :
10.1109/SIM.2000.939225