DocumentCode
3320034
Title
The Hurricane Imaging Radiometer wide swath simulation and wind speed retrievals
Author
Amarin, Ruba A. ; Jones, Linwood ; Johnson, James ; Ruf, Chris ; Miller, Timothy L. ; Uhlhorn, Eric
Author_Institution
Central Florida Remote Sensing Lab., Univ. of Central Florida, Orlando, FL, USA
fYear
2010
fDate
25-30 July 2010
Firstpage
4290
Lastpage
4293
Abstract
The knowledge of peak winds in hurricanes is critical to classification of hurricane intensity; therefore, there is a strong interest in the operational remote sensing of ocean surface winds for monitoring tropical storms and hurricanes, especially those which threaten landfall. Presently, the airborne Stepped Frequency Microwave Radiometer (SFMR) is the state-of-the-art remote sensor for providing this information in real-time, during hurricane surveillance flights. However, for the future, NASA and NOAA are collaborating in the development of the Hurricane Imaging Radiometer (HIRAD), which is a prototype of the next-generation high-flying airborne instrument for monitoring hurricanes. This paper describes a realistic end-to-end simulation of HIRAD hurricane measurements while flying on an unmanned Global Hawk aircraft. The objective of this research is to develop baseline retrieval algorithms and provide a wind speed measurement accuracy assessment for the upcoming NASA hurricane field program, Genesis and Rapid Intensification Processes (GRIP), to be conducted in 2010.
Keywords
airborne radar; radiometers; remote sensing; storms; airborne stepped frequency microwave radiometer; hurricane imaging radiometer; hurricane surveillance; ocean surface wind; remote sensing; unmanned Global Hawk aircraft; wide swath simulation; wind speed measurement; Atmospheric modeling; Computational modeling; Hurricanes; Microwave radiometry; Ocean temperature; Rain; Wind speed; HIRAD; hurricane imaging; microwave radiometry; wind speed retrievals;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5650693
Filename
5650693
Link To Document