DocumentCode :
3320324
Title :
Time and temperature dependent mechanical characterization of polymer-based materials in electronic packaging application
Author :
Kuo, Chia-Tai ; Yip, Ming-Chuen ; Chiang, Kuo-Ning ; Jen, Yi-Ming
Author_Institution :
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear :
2002
fDate :
4-6 Dec. 2002
Firstpage :
188
Lastpage :
196
Abstract :
The thermo-mechanical testing of high performance polyimide films Type HPP-ST supplied by Dupont® is preceded under different strain rate and temperature environments. The stress-strain behavior of materials is simulated with constitutive framework, and the dependence of Young´s modulus on temperature and strain rate is reported. In view of the uncertainty of the Young´s modulus determination, the specimens were tested with unloading-reloading to verify the test results. Constant strain rate uniaxial tensile test and long-term creep test at various temperatures are preceded to characterize the time-temperature-dependent mechanical property precisely. Cyclic loading test was also performed on the specimen to investigate cyclic stress-strain behaviors. There is no research definitely related in the past, therefore the research is expected to enhance the finite-element-modeling accuracy and characterize the material properties.
Keywords :
Young´s modulus; creep testing; finite element analysis; packaging; polymer films; tensile testing; Dupont; HPP-ST; Young´s modulus; electronic packaging application; finite-element-modeling accuracy; long-term creep test; polyimide films; polymer-based materials; stress-strain behavior; temperature dependent mechanical characterization; thermo-mechanical testing; uniaxial tensile test; unloading-reloading; Capacitive sensors; Electronics packaging; Polyimides; Polymers; Temperature dependence; Tensile strain; Testing; Thermomechanical processes; Uncertainty; Uniaxial strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN :
0-7803-7682-X
Type :
conf
DOI :
10.1109/EMAP.2002.1188836
Filename :
1188836
Link To Document :
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