Title :
Current-mode BIST structure for mixed-signal circuits
Author :
Hsu, Chun-Lung ; Huang, Keh-Chang
Author_Institution :
Dept. of Electr. Eng., Nat. Dong Hwa Univ., Hualien, Taiwan
Abstract :
A current-mode built-in self-test (CMBIST) structure for mixed-signal testing is presented in this work. The proposed CMBIST structure is based on the use of operational transconductance amplifiers (OTAs) and can be applied for current testing of analogue or digital circuits. The proposed CMBIST structure can increase the number of test points, which can be simultaneously sampled and controlled using current test data, thus taking less time for test signal observation. Additionally, the proposed CMBIST structure was fabricated in TSMC 1p4m CMOS 0.35 μm technology. Also, simulation results and experimental measurements were obtained to verify the theoretical analysis. The results show that the proposed CMBIST structure is fully testable.
Keywords :
CMOS integrated circuits; built-in self test; circuit simulation; current-mode circuits; electric current measurement; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; operational amplifiers; 0.35 micron; CMBIST structure; CMOS; OTA; analogue/digital circuit current testing; current-mode BIST; current-mode built-in self-test; mixed-signal testing; operational transconductance amplifiers; Built-in self-test; Capacitors; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Packaging; Switches; Voltage control;
Conference_Titel :
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN :
0-7803-7682-X
DOI :
10.1109/EMAP.2002.1188839
