• DocumentCode
    3320378
  • Title

    Optical and electrical characterisation of iron-doped ZnO

  • Author

    Gaspar, C. ; Pereira, L. ; Costa, F.M. ; Monteiro, T. ; Han, Jiaping ; Senos, A.M.R. ; Mantas, P.

  • Author_Institution
    Dept. de Fisica, Aveiro Univ., Portugal
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    326
  • Lastpage
    329
  • Abstract
    The 1.7855 eV luminescence and electrical DC behaviour in polycrystalline ZnO are studied. Luminescence transient decay times of 1.4 ms and 23 ms are found at 11 K. While the first one remains constant with temperature the slower one decreases reaching a value of 5 ms at 160 K with an activation energy of 76 meV. A fast decrease of the intensity above 30 K with activation energy of 8 meV was found. Electrical DC measurements show a space charge limited current behaviour with an activation energy of 40 meV above 30 K. For lower temperatures a variable range hopping was found. Based on this data an excitonic model for the centre is proposed
  • Keywords
    II-VI semiconductors; deep levels; excitons; hopping conduction; impurity states; iron; photoluminescence; radiation quenching; radiative lifetimes; space-charge-limited conduction; spectral line intensity; time resolved spectra; wide band gap semiconductors; zinc compounds; 1.4 ms; 1.7855 eV; 11 K; 160 K; 23 ms; 30 K; 40 meV; 5 ms; 76 meV; 8 meV; ZnO:Fe; activation energy; electrical DC behaviour; excitonic model; iron-doped ZnO; luminescence intensity; luminescence transient decay times; space charge limited current behaviour; variable range hopping; Electric variables measurement; Iron; Luminescence; Optical sensors; Photonic band gap; Pollution measurement; Stimulated emission; Temperature distribution; Temperature measurement; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconducting and Insulating Materials Conference, 2000. SIMC-XI. International
  • Conference_Location
    Canberra, ACT
  • Print_ISBN
    0-7803-5814-7
  • Type

    conf

  • DOI
    10.1109/SIM.2000.939254
  • Filename
    939254