DocumentCode :
3320681
Title :
Thermal fatigue resistance of the Sn-9Zn-xAg lead-free solders/Cu interface
Author :
Chang, Tao-Chih ; Hon, Min-Hsiung ; Wang, Moo-Chin ; Lin, Dong-Yih
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fYear :
2002
fDate :
4-6 Dec. 2002
Firstpage :
307
Lastpage :
312
Abstract :
Thermal fatigue resistance of the Sn-9Zn-xAg lead-free solders/Cu interface has been investigated by pull-off test, X-ray diffractometer (XRD), scanning electron microscope (SEM) and energy dispersive spectrometer (EDS). Sn-9Zn-xAg lead-free solders offer better thermal fatigue resistances than 63Sn-37Pb solder alloy. The adhesion strength of the 63Sn-37Pb/Cu interface decreases from 5.53±1.0 MPa to 5.33±0.9 MPa with increasing thermal cycles from 1 to 5 times. The adhesion strength of the Sn-9Zn/Cu interface increases from 9.54±1.5 MPa to 13.79±0.9 MPa with increasing thermal cycles from 1 to 3 cycles and decreasing from 13.79±0.9 MPa to 8.5±0.8 MPa when tested for 5 cycles. The other Sn-9Zn-xAg solder alloys have the similar tendency and the maximum adhesion strength of solder/Cu interface is obtained as 21.41±1.5 MPa for Ag addition is 2.5 wt% and tested for 3 cycles. The intermetallic compound forms at the 63Sn-37Pb/Cu interface is η-Cu6Sn5. But η-Cu6Sn5 and Cu5Zn8 formed at the Sn-9Zn-0Ag/Cu interface and are η´-Cu6Sn5, η-Cu6Sn5, Cu5Zn8 for the Sn-9Zn-xAg/Cu interface. The fracture path for the Sn-9Zn-0Ag system transforms from the solder bulk to the Cu5Zn8/solder interface when tested for 3 cycles, the fracture paths of the other solders is within solder bulk even tested for 5 cycles.
Keywords :
X-ray chemical analysis; X-ray diffraction; adhesion; copper; fracture; interface phenomena; scanning electron microscopy; silver alloys; soldering; thermal stress cracking; tin alloys; zinc alloys; Cu5Zn8; Cu6Sn5; EDS; SEM; Sn-9Zn-xAg lead-free solders/Cu interface; Sn-9Zn-xAg solder alloys; SnZnAg-Cu; XRD; adhesion strength; fracture paths; intermetallic compound formation; pull-off test; thermal fatigue resistance; Adhesives; Environmentally friendly manufacturing techniques; Fatigue; Lead; Scanning electron microscopy; System testing; Thermal resistance; Tin; X-ray diffraction; Zinc;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN :
0-7803-7682-X
Type :
conf
DOI :
10.1109/EMAP.2002.1188856
Filename :
1188856
Link To Document :
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