DocumentCode :
3320765
Title :
Liquid/solid and solid/solid reactions between SnAgCu lead-free solders and Ni surface finish
Author :
Luo, Wei-Chen ; Kao, C. Robert
Author_Institution :
Dept. of Chem. & Matetials Eng., Nat. Central Univ., Taoyuan, Taiwan
fYear :
2002
fDate :
4-6 Dec. 2002
Firstpage :
330
Lastpage :
334
Abstract :
The SnAgCu series of solders are the most promising lead-free candidates to replace the Pb-Sn solders. The Ni metallization is one of the most common surface finishes for the electronic packages. During soldering (a liquid/solid reaction), the reaction between SnAgCu solders and Ni strongly depended on the Cu concentration. When the Cu concentration ≤ 0.2wt.%, only a continuous (Ni1-xCux)3Sn4 layer formed at the interface. When the Cu concentration´s 0.6 wt.%, (Ni1-xCux)3Sn4 disappeared, and only (Cu1-yNiy)6Sn5 was present. After soldering, samples were subjected to several different temperatures isothermal aging (a solid/solid reaction) for time as long as 1000 hours. When the reaction time was 200 hours at 180°C, it was surprising found that a discontinuous (Cu1-yNiy)6Sn5 intermetallic particles formed over the (Ni1-xCux)3Sn4 layer in the solid/solid reaction between Sn3.9Ag0.2Cu and Ni. At higher Cu concentration (≥0.6 wt.%), (Ni1-xCux)3Sn4 disappeared, and only (Cu1-yNiy)6Sn5 was present. It showed that the initial difference in the intermetallic compounds right after reflow can be aged out at high temperatures.
Keywords :
ageing; copper alloys; crystal microstructure; eutectic alloys; nickel; packaging; reflow soldering; silver alloys; tin alloys; (Cu1-yNiy)6Sn5; (Ni1-xCux)3Sn4; 1000 h; 180 degC; 200 h; Cu concentration; Ni; Ni metallization; Ni surface finish; Pb-free solders; Sn-Ag-Cu ternary eutectic; SnAgCu lead-free solders; SnAgCu-Ni; electronic packages; intermetallic compounds; isothermal aging; liquid/solid reaction; solder reflow; solid/solid reaction; Aging; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Metallization; Soldering; Solids; Surface finishing; Temperature; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2002. Proceedings of the 4th International Symposium on
Print_ISBN :
0-7803-7682-X
Type :
conf
DOI :
10.1109/EMAP.2002.1188860
Filename :
1188860
Link To Document :
بازگشت