DocumentCode :
3321378
Title :
Architectural Comparison of Analog and Digital Duty Cycle Corrector for High Speed I/O Link
Author :
Raghavan, Leneesh ; Wu, Ting
Author_Institution :
Rambus Inc., Bangalore, India
fYear :
2010
fDate :
3-7 Jan. 2010
Firstpage :
270
Lastpage :
275
Abstract :
To achieve high speed data signaling rates with the internal fast clock operating at half its speed,the XDR (extreme data rate) I/O link employs dual-edge signaling where in data bits are transmitted on both the edges (rise/fall) of transmit clock. Duty cycle correction technique is used to provide high frequency low jitter clocks that have 50% duty cycle. This paper compares two different techniques to implement duty cycle corrector (DCC). These techniques are implemented in high speed I/O operating at data rate of 4Gbps and 6.4Gbps in TSMC 65nm & TSMC 40nm technology achieving an output duty cycle error below ±2% for ±10% input duty cycle error.
Keywords :
clocks; jitter; TSMC; analog duty cycle corrector; data bits; digital duty cycle corrector; dual-edge signaling; duty cycle correction technique; duty cycle error; extreme data rate; high speed I/O link; high speed data signaling rate; jitter clock; transmit clock; Circuits; Clocks; Data communication; Digital control; Error correction; Frequency; Jitter; Signal design; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2010. VLSID '10. 23rd International Conference on
Conference_Location :
Bangalore
ISSN :
1063-9667
Print_ISBN :
978-1-4244-5541-6
Type :
conf
DOI :
10.1109/VLSI.Design.2010.83
Filename :
5401327
Link To Document :
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