Title :
Using statistics to reduce the uncertainty in system level susceptibility testing
Author :
Jennings, Paul ; Ball, Robert ; Lever, Peter
Author_Institution :
Adv. Technol. Centre, Warwick Univ., Coventry, UK
Abstract :
Products containing electronics must generally be tested for electromagnetic susceptibility, as part of their EMC certification process, at the end of their development cycle to ensure that the test is representative of any future use of the product. However, the earlier that the product as a whole, or the electronic systems that might form part of the product, can be tested for susceptibility, the more benefit can be gained from such a procedure. Both a saving in time and cost can be achieved in the product development process. This paper describes a statistical technique which has been developed for use in the automotive industry with a bulk current injection (BCI) test. It has been designed to help overcome the uncertainties in correlating results from such a system-level bench test with results from the final vehicle-level sign-off test carried out in a full-threat field within a semi-anechoic EMC chamber. The technique uses a probability distribution function with the mean transfer function and its standard deviation to estimate the risk of the test system, once installed in a vehicle, malfunctioning when that vehicle is exposed to radiation of a particular field strength and frequency. The effect of vehicle body dimensions on these risk figures has been examined and a simple mathematical model using statistical input data has been produced which shows some agreement with the measured data
Keywords :
automobile industry; automotive electronics; correlation methods; electromagnetic compatibility; electromagnetic interference; electronic equipment testing; probability; product development; statistical analysis; transfer functions; EMC certification; EMI; automotive industry; bulk current injection test; correlation; electromagnetic susceptibility; electronic systems; field strength, measured data; full-threat field; mathematical model; mean transfer function; probability distribution function; product development cycle; radiation; semianechoic EMC chamber; standard deviation; statistical technique; system level susceptibility testing; system-level bench test; test system risk; uncertainty reduction; vehicle body dimension; vehicle-level sign-off test; Certification; Costs; Electromagnetic compatibility; Electronic equipment testing; Frequency estimation; Product development; Statistics; System testing; Uncertainty; Vehicles;
Conference_Titel :
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3608-9
DOI :
10.1109/ISEMC.1995.523516