DocumentCode
3321972
Title
Parametric Fault Diagnosis of Nonlinear Analog Circuits Using Polynomial Coefficients
Author
Sindia, Suraj ; Singh, Virendra ; Agrawal, Vishwani D.
Author_Institution
Mixed Signal Syst. Group, Analog Devices Inc., Bangalore, India
fYear
2010
fDate
3-7 Jan. 2010
Firstpage
288
Lastpage
293
Abstract
We propose a method for diagnosis of parametric faults in analog circuits using polynomial coefficients of the circuit model. As a sequel to our recent work, where circuit response is modeled as polynomial for uncovering parametric faults in nonlinear circuits, we propose diagnosis of such faults using sensitivity of coefficients of the estimated polynomial to circuit parameters. The proposed method requires no design for test hardware as might be added to the circuit by some other methods. The proposed method is illustrated for a benchmark elliptic filter. It is shown to uncover several parametric faults causing deviations as small as 5% from the nominal values.
Keywords
analogue circuits; circuit reliability; elliptic filters; fault diagnosis; polynomials; circuit model; elliptic filter; nonlinear analog circuits; parametric fault diagnosis; polynomial coefficients; Analog circuits; Benchmark testing; Circuit faults; Circuit testing; Design methodology; Fault diagnosis; Filters; Hardware; Nonlinear circuits; Polynomials; fault diagnosis; nonlinear circuits; polynomial coefficients; sensitivity;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2010. VLSID '10. 23rd International Conference on
Conference_Location
Bangalore
ISSN
1063-9667
Print_ISBN
978-1-4244-5541-6
Type
conf
DOI
10.1109/VLSI.Design.2010.81
Filename
5401354
Link To Document