Title :
Fault tolerance in three-tier applications: focusing on the database tier
Author :
Vaysburd, Alexey
Author_Institution :
Lucent Technol., Bell Labs., Murray Hill, NJ, USA
Abstract :
Discusses the issues involved in providing an integrated fault tolerance solution to enterprise applications with a distributed three-tier architecture. We examine end-to-end fault tolerance requirements for interactions between the tiers and describe available solutions. We perform a detailed assessment of fault tolerance technologies that are available for the database tier, which poses most challenging reliability and high-availability problems. In particular, we discuss and compare the tradeoffs made in commercial database systems between different aspects of fault tolerance
Keywords :
business data processing; distributed databases; software architecture; software fault tolerance; availability; commercial database systems; database tier; distributed three-tier architecture; end-to-end fault tolerance requirements; enterprise applications; integrated fault tolerance solution; reliability; tier interactions; tradeoffs; Access protocols; Databases; Electrical capacitance tomography; Fault tolerance; Identity-based encryption; Logic; Network servers; Paper technology; User interfaces; Web server;
Conference_Titel :
Reliable Distributed Systems, 1999. Proceedings of the 18th IEEE Symposium on
Conference_Location :
Lausanne
Print_ISBN :
0-7695-0290-3
DOI :
10.1109/RELDIS.1999.805117
