DocumentCode :
3322269
Title :
Critical challenges in packaging MEMS devices
Author :
Darveaux, Robert ; Munukutla, Lakshmi
Author_Institution :
Dept. of Electron. & Comput. Eng. Technol., Arizona State Univ., Tempe, AZ
fYear :
2005
fDate :
11-12 April 2005
Firstpage :
210
Lastpage :
216
Abstract :
This paper reviews several current MEMS based products and highlights the critical packaging challenges for these devices. Several package configurations are shown, and issues around processing, material selection, and particle control are discussed. The package configurations are divided into three main groups: cavity packages, plastic molded packages, and wafer level packages. Several alternate process flows for these package types are reviewed, and the advantages and disadvantages of each flow are highlighted. Wafer bonding processes and anti-stiction measures are covered in some detail, since they are critical to many of the package configurations. The practice of silicone gel coating as a method of encapsulating MEMS devices is also discussed
Keywords :
coatings; encapsulation; micromechanical devices; plastic packaging; wafer bonding; MEMS devices; antistiction measures; cavity packages; encapsulating process; material selection; package configurations; packaging; particle control; plastic molded packages; silicone gel coating; wafer bonding processes; wafer level packages; Accelerometers; Electronics packaging; Gyroscopes; Microelectromechanical devices; Micromechanical devices; Optical sensors; Plastic packaging; Production; Wafer bonding; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 2005 IEEE/SEMI
Conference_Location :
Munich
Print_ISBN :
0-7803-8997-2
Type :
conf
DOI :
10.1109/ASMC.2005.1438797
Filename :
1438797
Link To Document :
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