DocumentCode :
3322284
Title :
Commutation failure of DC motor drives from voltage sags during regeneration
Author :
Fox, J. Curtiss ; Collins, E. Randolph
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., Clemson, SC
fYear :
2008
fDate :
Sept. 28 2008-Oct. 1 2008
Firstpage :
1
Lastpage :
9
Abstract :
DC motor drives are susceptible to nuisance tripping and faults during voltage sags. DC drives incorporating regenerative bridges are particularly vulnerable, and will often fault during a short-duration voltage sag. These faults can result in blown fuses or damaged power electronic components, and cause extended downtime for the end-user. During a voltage sag, thyristors can fail to commutate properly, leading to a ldquoshoot-throughrdquo fault or short circuit in the power electronic circuits. Commutation failure occurs chiefly because the thyristors are line commutated, and voltage sag can lead to insufficient voltage to commutate - causing a fault when a subsequent thyristor is fired. There are several possible scenarios that can cause commutation failure. This paper explores voltage sag situations that can cause commutation failure, simulations of DC drives operating in these situations, and experimental results that demonstrate commutation failure and faults in regenerative DC drives.
Keywords :
DC motor drives; commutation; failure analysis; power supply quality; DC motor drives; commutation failure; nuisance tripping; power electronic circuits; regenerative bridges; short-duration voltage sag; thyristor; Bridge circuits; Circuit faults; Commutation; DC motors; Power electronics; Power quality; Rectifiers; Thyristors; Voltage control; Voltage fluctuations; DC motor drives; SCRs; failure analysis; faults; regeneration; thyristors; voltage dips; voltage sags;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Harmonics and Quality of Power, 2008. ICHQP 2008. 13th International Conference on
Conference_Location :
Wollongong, NSW
Print_ISBN :
978-1-4244-1771-1
Electronic_ISBN :
978-1-4244-1770-4
Type :
conf
DOI :
10.1109/ICHQP.2008.4668867
Filename :
4668867
Link To Document :
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