DocumentCode :
3322531
Title :
Characterization of etched and Unetched Vertically Aligned Carbon Nanofibers (VACNFs) using Atomic Force Microscopy
Author :
Chalamalasetty, Siva Naga Sandeep ; Wejinya, Uchechukwu C. ; Dong, Zhuxin
Author_Institution :
Dept. of Microelectron.-Photonics, Univ. of Arkansas, Fayetteville, AR, USA
fYear :
2010
fDate :
18-22 Oct. 2010
Firstpage :
5786
Lastpage :
5791
Abstract :
One of the major limitations in the development of ultrasensitive electrochemical biosensors based on one dimensional nanostructures is the difficulty involved with uniform growth of the nanofibers. Fabrication of the Vertically Aligned Carbon Nano Fibers (VACNFs) involve treatment of several chemicals including a variety of etchants. In previous work, successful measurement and characterization of electron beam patterned VACNFs is demonstrated using Atomic Force Microscopy. In this paper, the effect of etchant on VACNFs dimension (height and diameter) is observed and characterized using a highly sensitive and precise Atomic Force Microscopy (AFM). Furthermore, statistical analysis is performed on AFM measured data to demonstrated data confidence.
Keywords :
atomic force microscopy; biosensors; carbon fibres; electrochemical devices; nanofibres; statistical analysis; VACNF; atomic force microscopy; one dimensional nanostructures; statistical analysis; ultrasensitive electrochemical biosensors; vertically aligned carbon nanofibers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Robots and Systems (IROS), 2010 IEEE/RSJ International Conference on
Conference_Location :
Taipei
ISSN :
2153-0858
Print_ISBN :
978-1-4244-6674-0
Type :
conf
DOI :
10.1109/IROS.2010.5650835
Filename :
5650835
Link To Document :
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