DocumentCode :
3322609
Title :
A 486k S/s CMOS time-domain smart temperature sensor with −0.85°C/0.78°C voltage-calibrated error
Author :
Poki Chen ; Yi-Jiang Hu ; Jian-Cheng Liou ; Bo-Chang Ren
Author_Institution :
Dept. of Electron. & Comput. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2015
fDate :
24-27 May 2015
Firstpage :
2109
Lastpage :
2112
Abstract :
This paper presents the first voltage-calibrated CMOS time-domain smart temperature sensor to reduce the cost of mass production. A digitally adjustable relaxation oscillator designed as the temperature sensor vibrates between CMOS-based CTAT, PTAT voltage references with mutual curvature compensation to generate linear temperature-dependent output pulses. Voltage instead of temperature calibration is adopted to alleviate the impact of process variation and TDC is used for output coding. Fabricated in a TSMC 0.18-μm standard CMOS process, the proposed sensor is able to operate at a high speed of 486k samples/sec for SoC thermal monitoring. The active area is merely 0.122 mm2 and the inaccuracy is measured to be less than ±1°C for 15 test chips in a wide temperature range of -40°C to 120°C. The performance is even superior to some chips with one- or two-point temperature calibrations. A milestone is established for time-domain smart temperature sensor to get rid of the heavy burden of fixed-temperature calibration with reason error budget.
Keywords :
CMOS analogue integrated circuits; calibration; compensation; intelligent sensors; reference circuits; relaxation oscillators; system-on-chip; temperature measurement; temperature sensors; time-digital conversion; voltage measurement; CMOS time-domain smart temperature sensor; CTAT; PTAT; SoC thermal monitoring; TDC; TSMC standard CMOS process; cost reduction; digitally adjustable relaxation oscillator; fixed-temperature calibration; linear temperature dependent output pulse; mutual curvature compensation; size 0.18 mum; temperature -0.85 degC; temperature -40 degC to 120 degC; temperature 0.78 degC; voltage reference; voltage-calibrated error; CMOS integrated circuits; Calibration; Oscillators; Temperature distribution; Temperature measurement; Temperature sensors; Time-domain analysis; Time-domain temperature sensor; curvature compensation; time-to-digital converter; voltage-calibration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
Type :
conf
DOI :
10.1109/ISCAS.2015.7169095
Filename :
7169095
Link To Document :
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