Title :
Image denoising utilizing the scale-dependency in the contourlet domain
Author :
Sadreazami, H. ; Ahmad, M. Omair ; Swamy, M.N.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
Abstract :
A new contourlet-based method is introduced for reducing noise in images corrupted by additive white Gaussian noise. This method takes into account the statistical dependencies among the contourlet coefficients of different scales. In view of this, a non-Gaussian multivariate distribution is proposed to capture the across-scale dependencies of the contourlet coefficients. This model is then exploited in a Bayesian maximum a posteriori estimator to restore the clean coefficients by deriving an efficient closed-form shrinkage function. Experimental results are performed to evaluate the performance of the proposed denoising method using typical noise-free images contaminated by simulated noise. The results show that the proposed method outperforms some of the state-of-the-art methods in terms of both the subjective and objective criteria.
Keywords :
AWGN; Bayes methods; image denoising; maximum likelihood estimation; statistical distributions; Bayesian maximum-a-posteriori estimator; across-scale dependencies; additive white Gaussian noise; closed-form shrinkage function; contourlet domain; contourlet-based method; image denoising; noise reduction; nonGaussian multivariate distribution; scale-dependency utilization; statistical dependencies; Bayes methods; Hidden Markov models; Image denoising; Noise; Noise measurement; Noise reduction; Transforms; Bayesian MAP estimator; Contourlet transform; image denoising; multivariate distribution;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7169105