DocumentCode :
3323073
Title :
Measuring process yield by fuzzy lower confidence bounds
Author :
Wu, Chien-Wei ; Liao, Mou-yuan
Author_Institution :
Dept. of Ind. Eng. & Syst. Manage., Feng Chia Univ., Taichung, Taiwan
Volume :
2
fYear :
2010
fDate :
5-7 May 2010
Firstpage :
103
Lastpage :
106
Abstract :
Process yield is one standard numerical measure of process performance in manufacturing industry. Index SPK has provided an exact measure of process yield. Most studies on estimating SPK are based on crisp estimates involving precise output process measurements. However, measurements of product quality sometimes cannot be precisely recorded or collected. Hence, this study provides the fuzzy lower confidence bound for SPK. The result helps the practitioners to make reliable decisions under fuzzy environment.
Keywords :
fuzzy set theory; inspection; manufacturing industries; process capability analysis; quality control; fuzzy lower confidence bounds; manufacturing industry; output process measurements; process performance; process yield; product quality; Automatic control; Communication system control; Computer aided manufacturing; Control systems; Fuzzy control; Fuzzy systems; Inspection; Manufacturing automation; Manufacturing industries; Measurement standards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Communication Control and Automation (3CA), 2010 International Symposium on
Conference_Location :
Tainan
Print_ISBN :
978-1-4244-5565-2
Type :
conf
DOI :
10.1109/3CA.2010.5533667
Filename :
5533667
Link To Document :
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