• DocumentCode
    332338
  • Title

    Effects of defects and impurities on electronic properties in skutterudites

  • Author

    Akai, Koji ; Kurisu, Hiroki ; Moriyama, Takashi ; Yamamoto, Setuo ; Matsuura, Mitsuru

  • Author_Institution
    Fac. of Eng., Yamaguchi Univ., Japan
  • fYear
    1998
  • fDate
    24-28 May 1998
  • Firstpage
    105
  • Lastpage
    108
  • Abstract
    The transport properties of non-doped and doped skutterudites are discussed, based on results of the band structure calculation. The calculation is carried out by the full-potential linearized augmented plane-wave (FLAPW) method with the generalized gradient approximation (GGA). Firstly the electronic structure of doped CoSb3 is calculated when an impurity atom is put in a void of the skutterudite structure. Secondly the thermoelectric power is calculated with the constant relaxation-time approximation in the skutterudite antimonides by using the realistic electron bands. RhSb3 differs from IrSb3 in the band structure near the Fermi level. This difference appears strongly in the thermoelectric power at a low doping case
  • Keywords
    APW calculations; Fermi level; band structure; cobalt compounds; defect states; density functional theory; impurity states; iridium compounds; rhodium compounds; semiconductor materials; thermoelectric power; CoSb3; FLAPW method; Fermi level; IrSb3; RhSb3; band structure; band structure calculation; constant relaxation-time approximation; defects; doped CoSb3; doped skutterudites; electronic properties; full-potential linearized augmented plane-wave; generalized gradient approximation; impurities; skutterudite antimonides; skutterudites; thermoelectric power; transport properties; Atomic measurements; Doping; Electrons; Impurities; Performance evaluation; Power measurement; Semiconductor materials; Tellurium; Thermoelectricity; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
  • Conference_Location
    Nagoya
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-4907-5
  • Type

    conf

  • DOI
    10.1109/ICT.1998.740328
  • Filename
    740328