Title :
A feature projection based adaptive pattern recognition network
Author :
Lee, James S J ; Bezdek, James C.
Author_Institution :
Boeing High Technol. Center, Seattle, WA, USA
Abstract :
An adaptive pattern recognition network is introduced which is based on multiprecision feature space projection and Bayes confidence combinations. The adaptive network has the following properties: it allows incremental accumulation and effective use of statistical data; for each pattern class, the network dynamically selects the most significant (weighted) features for classification; and the method allows fast incremental learning from training samples and provides for the dynamical introduction of new classes and new features or the exclusion of existing classes and features without retraining on the old data. The model implements the optimal Bayesian classifier without recourse to underlying assumptions about class probability distributions. The network is computationally efficient because it has a parallel architecture.<>
Keywords :
Bayes methods; adaptive systems; neural nets; pattern recognition; probability; Bayesian classifier; adaptive pattern recognition network; feature projection; machine learning; multiprecision feature space projection; pattern classification; probability distributions; training samples; Adaptive systems; Bayes procedures; Neural networks; Pattern recognition; Probability;
Conference_Titel :
Neural Networks, 1988., IEEE International Conference on
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/ICNN.1988.23884