Title :
(Bi,Sb,Te,Se) alloys: relationship between elaboration methods and applications
Author :
Scherrer, H. ; Chitroub, M. ; Roche, C. ; Scherrer, S.
Author_Institution :
Lab. de Phys. des Mater., Ecole des Mines, Nancy, France
Abstract :
We will recall briefly the thermoelectric data on single crystals of Bi, Sb, Te, Se alloys grown by the travelling heater method. The crystalline quality of these single crystals will be characterized by X-ray topography (Synchrotron Beam). The observed dislocations are parallel to the cleavage planes with a density of 105 cm-2. Other defects in relationship with the growth are also observed. The composition homogeneity of the crystal is analysed by thermal probe. The quality of the single crystals permits us to perform experiments on diffusion. We recall the results for the anisotropic diffusion coefficient of selenium in bismuth telluride along the solidus line and we propose a mechanism of atomic diffusion. An important increase of the growth rate up to 40 mm per day gives materials with an excellent figure of merit (Zp=3.10-3 K-1, Zn=3.10 -1 K-1)
Keywords :
antimony compounds; bismuth compounds; crystal growth from melt; crystal structure; dislocation density; self-diffusion; semiconductor growth; semiconductor materials; stoichiometry; thermoelectricity; zone melting; (Bi,Sb,Te,Se) alloys; BiSbTeSe; X-ray topography; anisotropic diffusion coefficient; atomic diffusion; bismuth telluride; composition homogeneity; diffusion; dislocation density; dislocations; elaboration methods; figure of merit; growth rate; selenium; single crystals; solidus line; thermoelectric data; travelling heater method; Anisotropic magnetoresistance; Bismuth; Crystallization; Crystals; Probes; Surfaces; Synchrotrons; Tellurium; Thermoelectricity; Tin alloys;
Conference_Titel :
Thermoelectrics, 1998. Proceedings ICT 98. XVII International Conference on
Conference_Location :
Nagoya
Print_ISBN :
0-7803-4907-5
DOI :
10.1109/ICT.1998.740331