DocumentCode
332354
Title
Observation by soft-X-ray laser interferometry of niobium cathode surface evolution during very high electric field application
Author
Zeitoun-Fakiris, A. ; Boussoukaya, M. ; Zeitoun, Ph. ; Albert, F. ; Carillon, A. ; Jaeglé, P. ; Jamelot, G. ; Klisnick, A. ; Ros, D. ; Joyeux, D. ; Phalippou, D.
Author_Institution
CEA, Centre d´´Etudes Nucleaires de Saclay, Gif-sur-Yvette, France
Volume
1
fYear
1998
fDate
17-21 Aug 1998
Firstpage
24
Abstract
We present the very first experiment allowing in-situ observation of surface evolution during very high electric field application. This has been achieved by soft X-ray laser (λ=21.2 nm) Fresnel bi-mirror interferometry. The surface under study was a niobium planar cathode opposite a stainless steel bladelike anode. The applied field range on the cathode was E≈9-50 MV/m. The interferograms where single shot recorded of 80 ps duration allowing to quasi-instantaneously probe the surface morphology. The delay between two shots was 20 min while electric field has been kept on. The comparison of successive interferograms gives the Nb surface evolution over several hours. Thus, we observed the appearance of defects a few nanometers high and their evolution with time. Such a technique makes it possible to detect the preliminary stages of a discharge
Keywords
X-ray lasers; anodes; cathodes; electric fields; field emission; light interferometry; niobium; stainless steel; Fresnel bi-mirror interferometry; Nb; Nb surface evolution; electric field; high electric field; in-situ observation; interferograms; niobium cathode surface; niobium planar cathode; quasi-instantaneously probe; soft X-ray laser; soft-X-ray laser interferometry; stainless steel bladelike anode; surface evolution; surface morphology; Anodes; Cathodes; Delay; Interferometry; Niobium; Probes; Steel; Surface discharges; Surface morphology; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location
Eindhoven
ISSN
1093-2941
Print_ISBN
0-7803-3953-3
Type
conf
DOI
10.1109/DEIV.1998.740564
Filename
740564
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