DocumentCode :
332358
Title :
On the screening of the electric field at the cathode surface by an electron space charge at intense field emission
Author :
Batrakov, A.V. ; Pegel, I.V. ; Proskurovsky, D.I.
Author_Institution :
Inst. of High-Current Electron., Acad. of Sci., Tomsk, Russia
Volume :
1
fYear :
1998
fDate :
17-21 Aug 1998
Firstpage :
44
Abstract :
The paper considers the effect of the space charge of emitted electrons on the electric field at the tip of a field emitter. To analyze this phenomenon, the Poisson equation was solved numerically for a spherical vacuum diode with a field emission cathode. The dependence of the actual electric field on the geometric electric field has been compared with the known approximate dependencies. Strong screening of the electric field at the cathode by the space charge of emitted electrons at fields over 5×107 V/cm is noted. Based on the obtained dependencies of the actual field on the geometric one and using the SuperSAM code, the field emission occurring in a Muller projector has been simulated. It has been shown that the “ring effect” appearing in field emission patterns can well be explained by the field emission from the peripheral regions of the field emitter. The current density distributions over the surface and in the bulk of the emitter have been analyzed
Keywords :
cathodes; current density; electric fields; electron field emission; space charge; vacuum arcs; Muller projector; Poisson equation; SuperSAM code; cathode surface; current density distributions; electric field screening; electron space charge; field emission cathode; field emission patterns; field emitter tip; intense field emission; ring effect; spherical vacuum diode; Cathodes; Current density; Current-voltage characteristics; Diodes; Electron emission; Electrostatics; Levee; Poisson equations; Solid modeling; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 1998. Proceedings ISDEIV. XVIIIth International Symposium on
Conference_Location :
Eindhoven
ISSN :
1093-2941
Print_ISBN :
0-7803-3953-3
Type :
conf
DOI :
10.1109/DEIV.1998.740569
Filename :
740569
Link To Document :
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