• DocumentCode
    3324086
  • Title

    A 1.2V 1MS/s 7.65fJ/conversion-step 12-bit hybrid SAR ADC with time-to-digital converter

  • Author

    Sung-En Hsieh ; Cheng-Kang Ho ; Chih-Cheng Hsieh

  • Author_Institution
    Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2015
  • fDate
    24-27 May 2015
  • Firstpage
    2429
  • Lastpage
    2432
  • Abstract
    This paper presents a 12-bit hybrid successive approximation register (SAR) analog-to-digital converter (ADC) composed of common-mode based switching procedure and time-to-digital converter (TDC). For high-resolution requirement, several issues including the signal-dependent coupling in bootstrapped sample-and-hold circuit and parasitic loading effect of voltage-to-time converter are addressed by proposed design schemes. TDC implemented in oscillation-type adjustable delay cell is proposed with smaller area. Calibration circuit is also implemented to compensate inter-stage offset mismatch and least-significant-bit level alignment. The prototype fabricated in TSMC 0.18μm CMOS technology achieves an effective number of bit (ENOB) of 10.5 bits at 1.2-V supply, 1MS/s, and 11.16μW, resulting in a figure of merit (FOM) of 7.65 fJ/conversion-step.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; bootstrap circuits; calibration; circuit oscillations; coupled circuits; flip-flops; sample and hold circuits; time-digital conversion; CMOS technology; ENOB; FOM; TDC; TSMC; analog-to-digital converter; bootstrapped sample-and-hold circuit; calibration circuit; common-mode based switching procedure; complementary metal oxide semiconductor; effective number of bit; figure of merit; hybrid SAR ADC; inter-stage offset mismatch; least-significant-bit level alignment; oscillation-type adjustable delay cell; parasitic loading effect; signal-dependent coupling; size 0.18 mum; successive approximation register; time-to-digital converter; voltage 1.2 V; voltage-to-time converter; word length 12 bit; CMOS integrated circuits; Calibration; Capacitors; Couplings; Delays; Logic gates; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
  • Conference_Location
    Lisbon
  • Type

    conf

  • DOI
    10.1109/ISCAS.2015.7169175
  • Filename
    7169175