Title :
Probabilistic Event Extraction from RFID Data
Author :
Khoussainova, Nodira ; Balazinska, Magdalena ; Suciu, Dan
Author_Institution :
Comput. Sci. & Eng. Dept., Univ. of Washington, Seattle, WA
Abstract :
We present PEEX, a system that enables applications to define and extract meaningful probabilistic high-level events from RFID data. PEEX effectively copes with errors in the data and the inherent ambiguity of event extraction.
Keywords :
radiofrequency identification; RFID data; probabilistic event extraction; probabilistic high-level events; Application software; Cleaning; Computer errors; Computer science; Data engineering; Data mining; Event detection; Face detection; Radiofrequency identification; Uncertainty;
Conference_Titel :
Data Engineering, 2008. ICDE 2008. IEEE 24th International Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4244-1836-7
Electronic_ISBN :
978-1-4244-1837-4
DOI :
10.1109/ICDE.2008.4497596
