Title : 
Quick response, high accuracy standard optical power meter
         
        
            Author : 
Kuroda, Kenji ; Kodato, Setsuo
         
        
            Author_Institution : 
Anritsu Corp., Tokyo, Japan
         
        
        
            fDate : 
28 Oct-1 Nov 1991
         
        
        
            Abstract : 
A standard optical power meter has been developed that can be used to measure light from optical fibers as well as light beams. The optical detector element in this power meter consists of NiP optical absorption material, which has an ultralow reflectance and high reliability, and a μc-Ge:H film with excellent thermoelectric conversion efficiency characteristics. This standard optical power meter has a response time of 1.8 seconds, which is 1/3 the response time of conventional thermal detector elements, and a high accuracy of ±1.5% or better when measuring in the -15 dBm to +10 dBm level range at wavelengths of 0.4 μm to 1.8 μm
         
        
            Keywords : 
computerised instrumentation; detectors; elemental semiconductors; germanium; hydrogen; light absorption; meters; nickel compounds; optical variables measurement; semiconductor thin films; thermoelectric effects in semiconductors and insulators; 0.48 to 1.8 micron; 1.8 s; Ge:H; NiP; hybrid IC; light beams; microcomputer; microcrystallised semiconductor film; optical absorption material; optical detector; optical fibers; reliability; standard optical power meter; thermocouple; thermoelectric conversion efficiency; ultralow reflectance; Absorption; Delay; Measurement standards; Optical detectors; Optical fibers; Optical films; Optical materials; Power measurement; Reflectivity; Standards development;
         
        
        
        
            Conference_Titel : 
Industrial Electronics, Control and Instrumentation, 1991. Proceedings. IECON '91., 1991 International Conference on
         
        
            Conference_Location : 
Kobe
         
        
            Print_ISBN : 
0-87942-688-8
         
        
        
            DOI : 
10.1109/IECON.1991.238963