Title :
Research on Optical Properties for the Exponential-Doped Ga1-xAlxAs/GaAs Photocathode
Author :
Zhao, Jing ; Chang, Benkang ; Xiong, Yajuan ; Zhang, Yijun ; Zhang, Junju
Author_Institution :
Inst. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
Abstract :
To research the influencing factors in the optical properties of Ga1-xAlxAs/GaAs photocathode, one uniform-doped sample was prepared with the GaAs thickness of 2.00 μm and the Be-doping concentration of 1×1019 cm-3, and two more exponential-doped samples were 2.00 μm and 1.60 μm in the thickness whose Be-doping concentration quasi-exponentially distributed ranging from 1×1018 cm-3 to 1×1019 cm-3. The optical properties curves were separately measured by use of the spectrophotometer. Based on thin film optical principles, matrix model of the optical properties is built for the four-layer photocathode module with a structure of Glass/Si3N4/Ga1-xAlxAs/GaAs. The result shows that the photocathode with low average doping concentration and large thickness has high absorptivity within the response waveband. According to integral sensitivity equation, the optimized GaAs thickness of the exponential-doped Ga1-xAlxAs/GaAs photocathode is simulated to be 2.00 μm.
Keywords :
absorption coefficients; beryllium; doping profiles; gallium arsenide; gallium compounds; infrared spectra; photocathodes; semiconductor doping; ultraviolet spectra; visible spectra; Ga1-xAlxAs-GaAs:Be; SiO2-Si3N4-Ga1-xAlxAs-GaAs; absorptivity; doping concentration; exponential-doped photocathode; four-layer photocathode module; integral sensitivity equation; optical properties; spectrophotometer; thin film optical principles; Cathodes; Doping; Gallium arsenide; Optical films; Optical reflection; Optical sensors; Reflectivity;
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2011 Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-6555-2
DOI :
10.1109/SOPO.2011.5780485