Title :
Design for diagnosability of CMOS circuits
Author :
Xiaoqing, Wen ; Honzawa, Tooru ; Tamamoto, Hideo ; Saluja, Kewal K. ; Kinoshita, Kozo
Author_Institution :
SynTest Technol. Inc., Sunnyvale, CA, USA
Abstract :
This paper presents a new approach to improving the diagnosability of a CMOS circuit by dividing it into independent partitions and using a separate power supply for each partition. This technique makes it possible to implement multiple IDDQ measurement points. As a result, the diagnosability of the circuit can be improved. The problem of partitioning a circuit is addressed and optimum and heuristic solutions are proposed. The effectiveness of our approach is demonstrated through experimental results
Keywords :
CMOS digital integrated circuits; design for testability; fault diagnosis; integrated circuit design; integrated circuit testing; logic partitioning; logic testing; CMOS circuits; IDDQ testing; design for diagnosability; independent circuit partitions; multiple IDDQ measurement points; separate power supply; CMOS logic circuits; Circuit faults; Circuit simulation; Controllability; Electrical fault detection; Fault diagnosis; Manufacturing; Observability; Power measurement; Power supplies; Semiconductor device modeling;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741605
