Title :
Electron beam tester aided fault diagnosis for logic circuits based on sensitized paths
Author :
Yanagida, Nobuhiro ; Takahashi, Hiroshi ; Takamatsu, Yuzo
Author_Institution :
Kaminomoto Corp., Japan
Abstract :
In this paper, we propose an electron beam tester (EB-tester) aided fault diagnosis for combinational and sequential circuits based on sensitized paths. For combinational circuits, we enhance the previous set of sensitizing input pairs and present EB-tester aided fault diagnosis. For sequential circuits, we introduce a measure for selecting internal lines to be probed and present EB-tester aided fault diagnosis. Experimental results of ISCAS´85 and ISCAS´89 benchmark circuits show the efficiency of the presented methods
Keywords :
automatic testing; combinational circuits; electron beam testing; fault diagnosis; integrated circuit testing; large scale integration; logic testing; sequential circuits; ISCAS´85 benchmark circuits; ISCAS´89 benchmark circuits; combinational circuits; electron beam tester; fault diagnosis; internal lines; sensitized paths; sequential circuits; Circuit faults; Circuit testing; Combinational circuits; Computer science; Electron beams; Fault diagnosis; Large scale integration; Logic circuits; Logic testing; Sequential circuits;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741619
