• DocumentCode
    332611
  • Title

    A high speed IDDQ sensor for low-voltage ICs

  • Author

    Hashizume, Masaki ; Miura, Yukiya ; Ichimiya, Masahiro ; Tamesada, Takeomi ; Kinoshita, Kozo

  • Author_Institution
    Tokushima Univ., Japan
  • fYear
    1998
  • fDate
    2-4 Dec 1998
  • Firstpage
    327
  • Lastpage
    331
  • Abstract
    A new high speed Built-In Current (BIC) sensor is proposed, which is applicable for IDDQ tests of low power ICs. The layout of the sensor is designed with CMOS 1.2 μm technology. By using this sensor, resistive bridging faults in a circuit, whose supply voltage is 3.3 V, can be detected at the test speed of 66.7 MHz
  • Keywords
    CMOS digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit layout; integrated circuit testing; low-power electronics; 1.2 micron; 3.3 V; 66.7 MHz; CMOS technology; built-in current sensor; high speed IDDQ sensor; low power ICs; low-voltage ICs; resistive bridging faults; sensor layout; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Current measurement; Current supplies; Electrical fault detection; Integrated circuit testing; Logic testing; Low voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
  • ISSN
    1081-7735
  • Print_ISBN
    0-8186-8277-9
  • Type

    conf

  • DOI
    10.1109/ATS.1998.741634
  • Filename
    741634
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=332611