Title :
Dynamic power supply current testing of CMOS SRAMs
Author :
Liu, Jian ; Makki, Rafic Z. ; Kayssi, Ayman
Author_Institution :
Fujitsu Microelectron. Inc., San Jose, CA, USA
Abstract :
We describe the design and implementation of a dynamic power supply current sensor which is used to detect SRAM-specific faults such as disturb faults as well as logic cell faults. The sensor detects disturb faults by detecting abnormal levels of the power supply current. The sensor is embedded in the SRAM and offers on-chip detectability of faults
Keywords :
CMOS memory circuits; SRAM chips; electric current measurement; electric sensing devices; fault location; integrated circuit testing; logic testing; CMOS SRAMs; IDDT testing; SRAM-specific faults; current sensor; disturb faults; dynamic power supply current testing; embedded sensor; logic cell faults; onchip fault detectability; static RAM testing; Circuit faults; Circuit testing; Current supplies; Decoding; Electrical fault detection; Fault detection; Logic arrays; Logic circuits; Logic testing; Power supplies; Random access memory; Sensor arrays; Temperature sensors; Voltage;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741637
