DocumentCode
332612
Title
Dynamic power supply current testing of CMOS SRAMs
Author
Liu, Jian ; Makki, Rafic Z. ; Kayssi, Ayman
Author_Institution
Fujitsu Microelectron. Inc., San Jose, CA, USA
fYear
1998
fDate
2-4 Dec 1998
Firstpage
348
Lastpage
353
Abstract
We describe the design and implementation of a dynamic power supply current sensor which is used to detect SRAM-specific faults such as disturb faults as well as logic cell faults. The sensor detects disturb faults by detecting abnormal levels of the power supply current. The sensor is embedded in the SRAM and offers on-chip detectability of faults
Keywords
CMOS memory circuits; SRAM chips; electric current measurement; electric sensing devices; fault location; integrated circuit testing; logic testing; CMOS SRAMs; IDDT testing; SRAM-specific faults; current sensor; disturb faults; dynamic power supply current testing; embedded sensor; logic cell faults; onchip fault detectability; static RAM testing; Circuit faults; Circuit testing; Current supplies; Decoding; Electrical fault detection; Fault detection; Logic arrays; Logic circuits; Logic testing; Power supplies; Random access memory; Sensor arrays; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741637
Filename
741637
Link To Document