DocumentCode
332618
Title
Microsystems Testing: A Challenge
Author
Renovell, M.
fYear
1998
fDate
2-4 Dec 1998
Firstpage
512
Lastpage
512
Keywords
Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Design for testability; Digital circuits; Logic testing; Mechanical sensors; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741666
Filename
741666
Link To Document