DocumentCode :
332619
Title :
Bridging A Gap Between Microelectronics And Micromechanics Testing
Author :
Lubaszewski, Marcelo
fYear :
1998
fDate :
2-4 Dec 1998
Firstpage :
513
Lastpage :
513
Keywords :
Automatic testing; Design automation; Detectors; Electrical capacitance tomography; Electrical fault detection; Electronic equipment testing; Equations; Face detection; Failure analysis; Fault detection; Microelectronics; Thermal sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN :
1081-7735
Print_ISBN :
0-8186-8277-9
Type :
conf
DOI :
10.1109/ATS.1998.741667
Filename :
741667
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=332619
