Title :
Robust learning-based super-resolution
Author :
Kim, Changhyun ; Choi, Kyuha ; Lee, Ho-Young ; Hwang, Kyuyoung ; Ra, Jong Beom
Author_Institution :
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
Abstract :
Learning-based super-resolution algorithms synthesize a high-resolution image based on learning patch pairs of low- and high-resolution images. However, since a low-resolution patch is usually mapped to multiple high-resolution patches, unwanted artifacts or blurring can appear in super-resolved images. In this paper, we propose a novel approach to generate a high quality, high-resolution image without introducing noticeable artifacts. Introducing robust statistics to a learning-based super-resolution, we efficiently reject outliers which cause artifacts. Global and local constraints are also applied to produce a more reliable high-resolution image. Experimental results demonstrate that the proposed algorithm can synthesize higher quality, higher-resolution images compared to the existing algorithms.
Keywords :
image resolution; reliability; multiple high-resolution patches; reliability; robust learning; super resolution; Algorithm design and analysis; Estimation; Image resolution; Pixel; Robustness; Training data; Learning-based super-resolution; robust statistics;
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2010.5651057