Title :
Emerging resistive memories for low power embedded applications and neuromorphic systems
Author :
DeSalvo, B. ; Vianello, E. ; Thomas, O. ; Clermidy, F. ; Bichler, O. ; Gamrat, C. ; Perniola, L.
Author_Institution :
LETI, CEA, Grenoble, France
Abstract :
In this work, we will focus on the role that new nonvolatile resistive memory technologies can play in emerging fields of application, such as non-volatile logic circuits or neuromorphic circuits, to save energy and increase performance. Concerning the introduction of non-volatile functionalities at the logic level, we will demonstrate hybrid CMOS logic plus ReRAM (specifically CBRAM and OXRAM) circuits for ultra low power FPGA and fixed-logic IC design, as Non Volatile Flip-Flops. Concerning neuromorphic circuits, we will focus on the emulation of synaptic plasticity effects with resistive memory synapses. We will present large-scale energy efficient neuromorphic systems based on ReRAM as stochastic-binary synapses. Prototype applications such as complex visual- and auditory-pattern extraction will be also discussed using feedforward spiking neural networks.
Keywords :
CMOS logic circuits; field programmable gate arrays; flip-flops; low-power electronics; neural nets; resistive RAM; CBRAM circuits; OXRAM circuits; auditory-pattern extraction; complex visual-pattern extraction; feedforward spiking neural networks; fixed-logic IC design; hybrid CMOS logic plus ReRAM circuits; logic level; low power embedded applications; neuromorphic circuits; neuromorphic systems; nonvolatile flip-flops; nonvolatile functionality; nonvolatile resistive memory technology; resistive memory synapses; stochastic-binary synapses; synaptic plasticity effects; ultra low power FPGA; CMOS integrated circuits; Field programmable gate arrays; Hafnium compounds; Neural networks; Neuromorphics; Nonvolatile memory; Random access memory; Conductive-Bridge RAM; NV-FPGA; NV-Flip Flop; Oxide-ReRAM; ReRAM; artificial synapses; neuromorphic circuits;
Conference_Titel :
Circuits and Systems (ISCAS), 2015 IEEE International Symposium on
Conference_Location :
Lisbon
DOI :
10.1109/ISCAS.2015.7169340