Title :
Electrical aging of molybdenum field emitter
Author :
Lee, Jong Duk ; Oh, Cham Woo ; Park, Byung Gook
Author_Institution :
ISRC & SoEE, Seoul Nat. Univ., South Korea
Abstract :
As an approach to improve the stability of molybdenum field emitters with rough surfaces and impurities at the tip apex, electrical aging was studied on the basis of the important tip heating mechanism, the Nottingham effect, under DC bias and pulse conditions. The poor stability was improved remarkably using the change of tip temperature controlled by the electric field applied to the tip
Keywords :
ageing; current fluctuations; electric fields; electric heating; impurity distribution; molybdenum; stability; surface topography; temperature control; vacuum microelectronics; DC bias; Mo; Nottingham effect; electrical aging; molybdenum field emitters; pulse conditions; rough surfaces; stability; tip apex impurities; tip electric field; tip heating mechanism; tip temperature change; tip temperature control; Aging; Fluctuations; Impurities; Resistance heating; Rough surfaces; Stability; Surface roughness; Temperature control; Temperature distribution; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
DOI :
10.1109/IVMC.2001.939677
